Electron microprobes with WDS and EDS, magnetic sector SIMS systems, tomographic atom probes (TAP) from CAMECA France

SX 100: universal EPMA for Geology and Materials

SX 100 R:shielded EPMA for radioactive samples 

SX software upgrades: software for SX50, 51 and 100

IMS 7f : universal magnetic sector SIMS for Materials and Semiconductors
IMS 7f-GEO: magnetic sector SIMS for Geology
IMS Wf/ SC Ultra: magnetic sector SIMS for advanced semiconductor technology 
NanoSIMS 50 and NS50L: SIMS microprobe for ultra fine feature analysis in Materials, Geology, Planetary and Life sciences
IMS 1280: large radius magnetic sector SIMS for Geology
SIMS 4550: universal quadrupole SIMS for Semiconductors and Materials
SIMS 4600: full-wafer quadrupole SIMS for semiconductors

LA-WATAP : 3D Atom probe for semiconductors and materials